Validate the structural and functional integrity of a complex 3D multi-die SoC integrating logic (FinFET) and compute-in-memory (FinFET/FDSOI/ULL/DRAM) dies using face-to-face and TSV-based stacking. This role will involve system-level package co-simulation, inter-die test coverage planning, and deep collaboration with foundries and OSATs to ensure robust thermal, mechanical, and electrical integrity.
Perform cross-die and die-to-package interface verification using advanced 3DIC tools (Cadence 3D-IC, Synopsys 3DIC Compiler).
Manage and align multi-PDK die abstraction models, IO ring integration, and DRC/LVS across die boundaries.
Co-simulate package and die stack for parasitic-aware timing, leakage, IR drop, and signal integrity.
Develop and implement pre-silicon testbenches to validate custom die-to-die interfaces and protocol correctness.
Collaborate directly with foundry and OSAT technical teams to support TSV planning, microbump alignment, and die-to-die connectivity strategy.
Lead package-level thermal and mechanical stress modeling, and actively drive thermal closure with iterative layout optimizations.
7+ years of experience in SoC physical integration or packaging-aware verification for complex ASIC or multi-die systems.
Proven expertise in 2.5D/3D SoC stack development including F2F and F2B bonding, TSV and microbump design.
Hands-on experience integrating dies from multiple PDKs with dissimilar process nodes, voltage domains, and metal stacks.
Strong understanding of multi-die thermal modeling, die attach thermal paths, and IR/conduction-aware layout.
Demonstrated ability to interface with foundry and OSAT teams for technical bring-up, reliability, and stack planning.
Tools: Cadence 3D-IC, Allegro Package Designer, ANSYS Thermal, Redhawk, Synopsys IC Compiler II, and Calibre 3D DRC/LVS