Product Development Engineer

Test Engineer

What You Do At AMD Changes Everything At AMD, our mission is to build great products that accelerate next-generation computing experiences—from AI and data centers, to PCs, gaming and embedded systems. Grounded in a culture of innovation and collaboration, we believe real progress comes from bold ideas, human ingenuity and a shared passion to create something extraordinary. When you join AMD, you'll discover the real differentiator is our culture. We push the limits of innovation to solve the world's most important challenges—striving for execution excellence, while being direct, humble, collaborative, and inclusive of diverse perspectives. Join us as we shape the future of AI and beyond. Together, we advance your career.

The Role

Test Engineering is a cost, quality, and time-to-market driven team responsible for enabling the availability of microprocessors to our customers. Pre-silicon responsibilities for the Test Engineer include understanding product features, developing characterization test plans, highlighting test coverage holes, and developing software and hardware infrastructure to execute those plans. This requires interaction with Design and Platform Engineering and allows for the opportunity to provide test enhancement feedback for future designs. Post-silicon responsibilities include microprocessor debug & analysis and the execution of characterization plans. This may include silicon performance issues, yield issues, manufacturing processes, and device marginalities. The Test Engineer will work closely with Design and Platform Engineering to root cause issues that result from the debug, characterization and margin analysis. The Test Engineer will also provide datasheet specifications and drive improvements in yield.

Key Responsibilities

Position includes test planning, test creation, characterization, data analysis, and silicon debug of microprocessors in leading edge process technologies. Includes: development and debug of ATE test patterns and test flows, ensuring device testability and manufacturability from development through production, optimization of test flows for increased quality and cost improvement, analysis of part failures leading to test flow improvement, characterization and debug of new silicon designs and process technologies, and analysis of characterization data.

Preferred Experience

Scan/ATPG Applicant should be familiar with scan hardware compressions, failure mechanisms and debug processes AC scan (at-speed) development, debug, test and characterization Array Applicant should be familiar with modern SRAM cell operation. SRAM debug, characterization, test or design knowledge Memory BIST engine knowledge Analog/Mixed Signal Applicant should be familiar with modern microprocessor architecture and analog DFT Automated Test Equipment (ATE) platform Verigy 93K Applicant familiar with tester infrastructure including HW, SW, timing, levels, patterns Test methodologies for OpenShorts/BoundaryScan and other connectivity-based testing. Strong communication skills including data presentation Java, Perl, C++ coding skills ATE test experience Unix proficiency Modern computer architecture knowledge ATE test program knowledge JTAG knowledge

Academic Credentials

BS/MS EE or equivalent

Location: Austin, TX